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Cross talk and QE extraction

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Cross-talk can be introduced both optically and electrically. Due to the wave nature of the optical input, imperfect color filtering, and alignment mismatch in the optical stack, some light will bleed into neighbouring sub-pixels, generating charge in the silicon. Additionally, charge generated from light absorbed in the target sub-pixel may also diffuse into neighbouring sub-pixels and be collected by an adjacent well.

 

Solvers

FDTD

CHARGE

Associated files

cis-QE.ldev

cis-QE.fsp

cis-QE.lsf

Igen.txt

P_blue.txt

See also

CMOS image sensors

Related publications

F. Hirigoyen, A. Crocherie, J. M. Vaillant, and Y. Cazaux, “FDTD-based optical simulations methodology for CMOS image sensors pixels architecture and process optimization” Proc. SPIE 6816, 681609 (2008)

 

Wang, Xinyang, "Noise in Sub-Micron CMOS Image Sensors", Ph.D. Thesis, Delft University of Technology

cmos_image_zoom63

 

 

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