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Dark Current Extraction

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The cost of CMOS image sensor pixel-based digital camera systems is being reduced through the use of smaller pixel sizes and larger fill-factors. However, CMOS pixel size reduction is only acceptable without sacrificing image quality. As CMOS pixel sizes continue to decrease, there is a reduction in image signal to noise as well as an increase in cross-talk between adjacent sensor pixels. These effects can be offset by careful design optimization through computer simulation.


In this topic we discuss the contributions to the dark current noise source, and the simulation techniques required for the dark current and dark current shot noise calculations.




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See also

CMOS image sensors

Related publications

F. Hirigoyen, A. Crocherie, J. M. Vaillant, and Y. Cazaux, “FDTD-based optical simulations methodology for CMOS image sensors pixels architecture and process optimization” Proc. SPIE 6816, 681609 (2008)


Wang, Xinyang, "Noise in Sub-Micron CMOS Image Sensors", Ph.D. Thesis, Delft University of Technology






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